Dr. David C. Joy

Distinguished Professor

D.Phil., University of Oxford (UK): A Study of Magnetic Domains in the SEM

Brief Bio

David Joy received his D.Phil from the University of Oxford (UK) in 1969 and became Royal Society Warren Research Fellow in the Department of Materials Science and Engineering, Oxford. There he was responsible for designing and building the first field emission gun scanning transmission electron microscope (in Europe. In 1974 he became a Member of Technical Staff at AT&T Bell Laboratories in Murray Hill, NJ where he designed and built the first practical high performance electron energy loss spectrometer (EELS).  In 1987 he accepted joint positions as a Distinguished Professor at The University of Tennessee and as a Distinguished Scientist at Oak Ridge National Laboratory. His work there has concentrated on the development of advanced techniques for microscopy, microanalysis, and interpretation. He produced the first practical Monte Carlo simulations of electron interactions in solids, pioneered the development of ‘environmental’ electron microscopes, and led the US development of Electron Holography. Now he is  Theme Leader for Microscopy at the Center for Nanophase Materials Science at Oak Ridge, and his current research is on environmental microscopy and novel techniques such as helium ion beam microscopy.

Research Areas

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Monte Carlo modeling of electron and ion interactions in solids
Metrology and Electron Beam Fabrication of nanostructures
Advanced techniques for electron beam imaging and microanalysis

Selected Awards and Honors

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2002 National Winner Battelle Laboratories Prize for Nanoscience
2000 NIST Award “Author of one of the Top One Hundred Papers” in NIST Journal
1999 SRC  Award for ‘Distinguished Research’  
1983 Fellow of the Royal Microscopical Society, London (UK)

Professional Activities

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Editor-in-Chief SCANNING
Past President Microscopy Society of America
Past President Microbeam Analysis Society
Charter Member NIH Microscopical Imaging Study Section
Member Organizing Committee SPIE Advanced Lithography Meeting

Selected Publications

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Costa J L, Joy D C, Maher D M, Kirk K L, and Hui S M, “Fluorinated Molecule as a Tracer:
Difluoro-serotonin in Human Platelets”, Science, 200, p 537-539,(1978)

Joy D C and Maher D M, “Inner Shell Electron Spectroscopy for Microanalysis”, Science, 206,
p 162-6, (1979)

Joy D C, “Monte Carlo Modeling for Electron Microscopy and Microanalysis”, Oxford University Press: New York,  216pp, (1995) 

Goldstein J, Newbury D E, Joy D C, Lyman C, Echlin P E, Lifshin E, Sawyer L, and Michael J, “Scanning Electron Microscopy and X-ray Microanalysis”, 3rd Edition, Kluwer Academic/ Plenum Publishers , 689pp, (2003)

Voelkl E, Allard L F, Joy D C, “Introduction to Electron Holography”, Kluwer  Academic:New York,  354pp, (1999)

 

Selected Patents

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David C Joy, Daniel M Herr, Patent # 6730443 “Patterning Methods and Systems using Reflected Interference Patterns”

 

Contact Dr. Joy

Rm 232 Science and Engineering Research Facility
Department of Materials Science and Engineering
University of Tennessee
Knoxville, TN 37996-2200
Tel: (865) 974-3642

Email: djoy@utk.edu